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[IEEE 2011 IEEE 17th International On-Line Testing Symposium (IOLTS 2011) - Athens, Greece (2011.07.13-2011.07.15)] 2011 IEEE 17th International On-Line Testing Symposium - Self-checking test circuits for latches and flip-flops

✍ Scribed by Ribas, Renato P.; Sun, Yuyang; Reis, Andre I.; Ivanov, Andre

Book ID: 121726098
Publisher: IEEE
Year: 2011
Weight: 230 KB
Category: Article
ISBN: 1457710536
DOI: 10.1109/IOLTS.2011.5993846

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