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[IEEE 2011 IEEE 17th International On-Line Testing Symposium (IOLTS 2011) - Athens, Greece (2011.07.13-2011.07.15)] 2011 IEEE 17th International On-Line Testing Symposium - Variability-aware task mapping strategies for many-cores processor chips

✍ Scribed by Chaix, Fabien; Bizot, Gilles; Nicolaidis, Michael; Zergainoh, Nacer-Eddine

Book ID: 125809958
Publisher: IEEE
Year: 2011
Weight: 532 KB
Category: Article
ISBN: 1457710536
DOI: 10.1109/IOLTS.2011.5993811

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