𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2011 IEEE 17th International On-Line Testing Symposium (IOLTS 2011) - Athens, Greece (2011.07.13-2011.07.15)] 2011 IEEE 17th International On-Line Testing Symposium - Noise margin, critical charge and power-delay tradeoffs for SRAM design

✍ Scribed by Rajendran, Aravind; Shiyanovskii, Yuriy; Wolff, Frank; Papachristou, Chris

Book ID: 120302530
Publisher: IEEE
Year: 2011
Weight: 248 KB
Category: Article
ISBN: 1457710536
DOI: 10.1109/IOLTS.2011.5993828

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2011 IEEE 17th International On-Li

[IEEE 2011 IEEE 17th International On-Line Testing Symposium (IOLTS 2011) - Athens, Greece (2011.07.13-2011.07.15)] 2011 IEEE 17th International On-Line Testing Symposium - Rise of the hardware Trojans

✍ Sunar, Berk 📂 Article 📅 2011 🏛 IEEE ⚖ 65 KB

[IEEE 2011 IEEE 17th International On-Li

[IEEE 2011 IEEE 17th International On-Line Testing Symposium (IOLTS 2011) - Athens, Greece (2011.07.13-2011.07.15)] 2011 IEEE 17th International On-Line Testing Symposium - Loopback output router for reliable Network on Chip

✍ Killian, C.; Tanougast, C.; Monteiro, F.; Dandache, A. 📂 Article 📅 2011 🏛 IEEE ⚖ 384 KB

[IEEE 2011 IEEE 17th International On-Li

[IEEE 2011 IEEE 17th International On-Line Testing Symposium (IOLTS 2011) - Athens, Greece (2011.07.13-2011.07.15)] 2011 IEEE 17th International On-Line Testing Symposium - Matrix control-flow algorithm-based fault tolerance

✍ Ferreira, Ronaldo Rodrigues; Moreira, Alvaro Freitas; Carro, Luigi 📂 Article 📅 2011 🏛 IEEE ⚖ 227 KB

[IEEE 2011 IEEE 17th International On-Li

[IEEE 2011 IEEE 17th International On-Line Testing Symposium (IOLTS 2011) - Athens, Greece (2011.07.13-2011.07.15)] 2011 IEEE 17th International On-Line Testing Symposium - Self-checking test circuits for latches and flip-flops

✍ Ribas, Renato P.; Sun, Yuyang; Reis, Andre I.; Ivanov, Andre 📂 Article 📅 2011 🏛 IEEE ⚖ 230 KB

[IEEE 2011 IEEE 17th International On-Li

[IEEE 2011 IEEE 17th International On-Line Testing Symposium (IOLTS 2011) - Athens, Greece (2011.07.13-2011.07.15)] 2011 IEEE 17th International On-Line Testing Symposium - Error correction encoding for multi-threshold capture mechanism

✍ Karmarkar, Kedar; Tragoudas, Spyros 📂 Article 📅 2011 🏛 IEEE ⚖ 406 KB

[IEEE 2011 IEEE 17th International On-Li

[IEEE 2011 IEEE 17th International On-Line Testing Symposium (IOLTS 2011) - Athens, Greece (2011.07.13-2011.07.15)] 2011 IEEE 17th International On-Line Testing Symposium - RVC-based time-predictable faulty caches for safety-critical systems

✍ Abella, Jaume; Quinones, Eduardo; Cazorla, Francisco J.; Valero, Mateo; Sazeides 📂 Article 📅 2011 🏛 IEEE ⚖ 235 KB