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[IEEE 2011 6th IEEE International Symposium on Industrial Embedded Systems (SIES) - Vasteras, Sweden (2011.06.15-2011.06.17)] 2011 6th IEEE International Symposium on Industrial and Embedded Systems - Video subset selection for measurement based Worst Case Execution Time analysis

✍ Scribed by Wheeler, Sitsofe; Bate, Iain; Bartlett, Mark

Book ID: 126724826
Publisher: IEEE
Year: 2011
Weight: 889 KB
Category: Article
ISBN: 1612848184
DOI: 10.1109/SIES.2011.5953664

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