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[IEEE 2011 6th IEEE International Symposium on Industrial Embedded Systems (SIES) - Vasteras, Sweden (2011.06.15-2011.06.17)] 2011 6th IEEE International Symposium on Industrial and Embedded Systems - Synthesis of diagnostic techniques based on an IEC 61508-aware metamodel

✍ Scribed by Sojer, Dominik; Knoll, Alois; Buckl, Christian

Book ID: 126615285
Publisher: IEEE
Year: 2011
Weight: 991 KB
Category: Article
ISBN: 1612848184
DOI: 10.1109/SIES.2011.5953680

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