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[IEEE 2011 22nd Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Saratoga Springs, NY, USA (2011.05.16-2011.05.18)] 2011 IEEE/SEMI Advanced Semiconductor Manufacturing Conference - Establishing continuous flow manufacturing in a Wafertest-environment via value stream design

✍ Scribed by Keil, Sophia; Schneider, Germar; Eberts, Dietrich; Wilhelm, Kristina; Gestring, Ingo; Lasch, Rainer; Deutschlander, Arthur

Book ID: 126791144
Publisher: IEEE
Year: 2011
Weight: 409 KB
Category: Article
ISBN: 1612844081
DOI: 10.1109/asmc.2011.5898196

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