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[IEEE 2011 16th North-East Asia Symposium on Nano, Information Technology and Reliability (NASNIT) - Macao, China (2011.10.24-2011.10.26)] The 16th North-East Asia Symposium on Nano, Information Technology and Reliability - Semi-automatic test assertion transformation scheme for SOA

โœ Scribed by Youngkon Lee,


Book ID
126754900
Publisher
IEEE
Year
2011
Weight
325 KB
Category
Article
ISBN
8988678621

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