[IEEE 2011 16th North-East Asia Symposium on Nano, Information Technology and Reliability (NASNIT) - Macao, China (2011.10.24-2011.10.26)] The 16th North-East Asia Symposium on Nano, Information Technology and Reliability - FGTMR - Fine grain redundancy method for reconfigurable architectures under high failure rates

✍ Scribed by Niknahad, Mahtab; Sander, Oliver; Becker, Juergen

• Book ID: 118134714
• Publisher: IEEE
• Year: 2011
• Weight: 844 KB
• Volume: 0
• Category: Article
• ISBN: 8988678621
• DOI: 10.1109/nasnit.2011.6111144