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[IEEE 2011 12th International Symposium on Quality Electronic Design (ISQED 2011) - Santa Clara, CA (2011.03.14-2011.03.16)] 2011 12th International Symposium on Quality Electronic Design - Comparative BTI reliability analysis of SRAM cell designs in nano-scale CMOS technology

✍ Scribed by Krishnappa, S K; Mahmoodi, H

Book ID: 120025749
Publisher: IEEE
Year: 2011
Weight: 531 KB
Category: Article
ISBN: 161284913X
DOI: 10.1109/ISQED.2011.5770755

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