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[IEEE 2011 12th International Conference on Ultimate Integration on Silicon (ULIS) - Cork, Ireland (2011.03.14-2011.03.16)] Ulis 2011 Ultimate Integration on Silicon - Influence of drain voltage on MOSFET threshold voltage determination by transconductance change and gm/Id methods

✍ Scribed by Rudenko, T.; Kilchytska, V.; Arshad, M. K. Md; Raskin, J.-P.; Nazarov, A.; Flandre, D.

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