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[IEEE 2011 12th International Conference on Ultimate Integration on Silicon (ULIS) - Cork, Ireland (2011.03.14-2011.03.16)] Ulis 2011 Ultimate Integration on Silicon - Revisited approach for the characterization of Gate Induced Drain Leakage

✍ Scribed by Rafhay, Quentin; Xu, Cuiqin; Batude, Perrine; Mouis, Mireille; Vinet, Maud; Ghibaudo, Gerard

No coin nor oath required. For personal study only.

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