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[IEEE 2011 12th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Sevilla, Spain (2011.09.19-2011.09.23)] 2011 12th European Conference on Radiation and Its Effects on Components and Systems - Impact of proton irradiation on strained triple gate SOI p- and n-MOSFETs

✍ Scribed by Agopian, P. G. D.; Martino, J. A.; Kobayashi, D.; Simoen, E.; Claeys, C.

Book ID: 126674496
Publisher: IEEE
Year: 2011
Weight: 366 KB
Category: Article
ISBN: 1457705850
DOI: 10.1109/RADECS.2011.6131291

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