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[IEEE 2010 International Conference on Microelectronics (ICM) - Cairo, Egypt (2010.12.19-2010.12.22)] 2010 International Conference on Microelectronics - Effective screening for NBTI effect on SRAM-based memory

✍ Scribed by Mohammad, Baker; Dadabhoy, Percy

Book ID: 125418840
Publisher: IEEE
Year: 2010
Weight: 807 KB
Category: Article
ISBN: 161284149X
DOI: 10.1109/icm.2010.5696167

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