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[IEEE 2010 International Conference on Microelectronics (ICM) - Cairo, Egypt (2010.12.19-2010.12.22)] 2010 International Conference on Microelectronics - ENOB calculation for ADCs with input-correlated quantization error using a sine-wave test

✍ Scribed by Weaver, Skyler; Hershberg, Benjamin; Moon, Un-Ku

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