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[IEEE 2010 International Conference on Measuring Technology and Mechatronics Automation (ICMTMA 2010) - Changsha City, China (2010.03.13-2010.03.14)] 2010 International Conference on Measuring Technology and Mechatronics Automation - An Efficient Automated Test Data Generation Method

✍ Scribed by Cui, Huanhuan; Chen, Li; Zhu, Bian; Kuang, Halei

Book ID: 120592398
Publisher: IEEE
Year: 2010
Weight: 298 KB
Category: Article
ISBN: 1424450012
DOI: 10.1109/ICMTMA.2010.556

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