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[IEEE 2010 International Conference on Measuring Technology and Mechatronics Automation (ICMTMA 2010) - Changsha City, China (2010.03.13-2010.03.14)] 2010 International Conference on Measuring Technology and Mechatronics Automation - Leaf Area Measurement Based on Image Processing

✍ Scribed by Lü, Chaohui; Ren, Hui; Zhang, Yibin; Shen, Yinhua

Book ID: 118003784
Publisher: IEEE
Year: 2010
Weight: 339 KB
Volume: 0
Category: Article
ISBN: 1424450012
DOI: 10.1109/icmtma.2010.141

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