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[IEEE 2010 International Conference on High Voltage Engineering and Application (ICHVE) - New Orleans, LA, USA (2010.10.11-2010.10.14)] 2010 International Conference on High Voltage Engineering and Application - Reliability and failure analysis of porcelain high-voltage surge arresters

✍ Scribed by Rossman, James B.; Droke, Mark A.; Nelson, Jeffrey H.

Book ID: 124170217
Publisher: IEEE
Year: 2010
Weight: 533 KB
Category: Article
ISBN: 1424482836
DOI: 10.1109/ICHVE.2010.5640776

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