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[IEEE 2010 International Conference on High Voltage Engineering and Application (ICHVE) - New Orleans, LA, USA (2010.10.11-2010.10.14)] 2010 International Conference on High Voltage Engineering and Application - Challenges for high voltage testing of UHV equipment

✍ Scribed by Gockenbach, Ernst

Book ID: 121812917
Publisher: IEEE
Year: 2010
Weight: 370 KB
Category: Article
ISBN: 1424482836
DOI: 10.1109/ICHVE.2010.5640870

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