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[IEEE 2010 International Conference on High Voltage Engineering and Application (ICHVE) - New Orleans, LA, USA (2010.10.11-2010.10.14)] 2010 International Conference on High Voltage Engineering and Application - Modelling of temporal temperature and pressure change due to partial discharge events within a spherical cavity in a solid dielectric material using finite element analysis

✍ Scribed by Illias, Hazlee A.; Chen, George; Lewin, Paul L.

Book ID: 118015995
Publisher: IEEE
Year: 2010
Weight: 364 KB
Volume: 0
Category: Article
ISBN: 1424482836
DOI: 10.1109/ichve.2010.5640716

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