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[IEEE 2010 IEEE Symposium on VLSI Technology - Honolulu, HI, USA (2010.06.15-2010.06.17)] 2010 Symposium on VLSI Technology - Study of channel length scaling in large-scale graphene FETs

✍ Scribed by Han, Shu-Jen; Sun, Yanning; Bol, Ageeth A.; Haensch, Wilfried; Chen, Zhihong

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