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[IEEE 2010 IEEE Symposium on VLSI Technology - Honolulu, HI, USA (2010.06.15-2010.06.17)] 2010 Symposium on VLSI Technology - Application of a statistical compact model for Random Telegraph Noise to scaled-SRAM Vmin analysis

✍ Scribed by Tanizawa, M.; Ohbayashi, S.; Okagaki, T.; Sonoda, K.; Eikyu, K.; Hirano, Y.; Ishikawa, K.; Tsuchiya, O.; Inoue, Y.

Book ID: 118027554
Publisher: IEEE
Year: 2010
Weight: 453 KB
Volume: 0
Category: Article
ISBN: 1424454514
DOI: 10.1109/vlsit.2010.5556184

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