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[IEEE 2010 IEEE International Vacuum Electronics Conference (IVEC) - Monterey, CA, USA (2010.05.18-2010.05.20)] 2010 IEEE International Vacuum Electronics Conference (IVEC) - P1–4: Design and stability analysis of a three-gap coupled output circuit with three modes overlapping

✍ Scribed by Min, Zhu; Jirun, Luo; Wei, Guo; Huibing, Cui; Yansheng, Zhang

Book ID: 117996641
Publisher: IEEE
Year: 2010
Weight: 453 KB
Volume: 0
Category: Article
ISBN: 1424470986
DOI: 10.1109/ivelec.2010.5503579

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