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[IEEE 2010 IEEE International Vacuum Electronics Conference (IVEC) - Monterey, CA, USA (2010.05.18-2010.05.20)] 2010 IEEE International Vacuum Electronics Conference (IVEC) - P1–15: Simulation and test of filter loaded three gap coupled output cavities

✍ Scribed by Wang, Shuzhong

Book ID: 117997325
Publisher: IEEE
Year: 2010
Weight: 186 KB
Volume: 0
Category: Article
ISBN: 1424470986
DOI: 10.1109/ivelec.2010.5503570

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