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[IEEE 2010 IEEE International SOI Conference - San Diego, CA, USA (2010.10.11-2010.10.14)] 2010 IEEE International SOI Conference (SOI) - Impact of back-gate biasing on ultra-thin silicon-on-insulator-based nanoribbon sensors

✍ Scribed by Fernandes, P. G.; Chapman, R. A.; Seitz, O.; Stiegler, H. J.; Wen, H. -C.; Chabal, Y. J.; Vogel, E. M.

No coin nor oath required. For personal study only.

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