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[IEEE 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Austin, TX, USA (2010.05.3-2010.05.6)] 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - High resolution led-spectroscopy for sensor application in harsh environment

✍ Scribed by Degner, M.; Damaschke, N.; Ewald, H.; Lewis, E.

Book ID: 118116392
Publisher: IEEE
Year: 2010
Weight: 745 KB
Volume: 0
Category: Article
ISBN: 1424428327
DOI: 10.1109/imtc.2010.5488239

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