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[IEEE 2010 IEEE Holm Conference on Electrical Contacts (Holm 2010) - Charleston, SC, USA (2010.10.4-2010.10.7)] 2010 Proceedings of the 56th IEEE Holm Conference on Electrical Contacts - Impact of Creep and Softening Mechanisms on the Contact Resistance of RF MEMS Ohmic Switches: Study of the Current and Time Effects on Au-to-Au Microcontacts in Static Contact Conditions

✍ Scribed by Souchon, Frederic; Peschot, Alexis; Charvet, Pierre Louis; Poulain, Christophe

Book ID: 115447179
Publisher: IEEE
Year: 2010
Weight: 933 KB
Volume: 0
Category: Article
ISBN: 1424481740
DOI: 10.1109/holm.2010.5619516

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