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[IEEE 2010 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) - Lixouri, Greece (2010.07.5-2010.07.7)] 2010 IEEE Computer Society Annual Symposium on VLSI - Modeling and Simulation of Multi-operation Microcode-Based Built-In Self Test for Memory Fault Detection and Repair

✍ Scribed by Sharma, R.K.; Sood, Aditi

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