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[IEEE 2010 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) - Lixouri, Greece (2010.07.5-2010.07.7)] 2010 IEEE Computer Society Annual Symposium on VLSI - Reliability-Aware Dynamic Voltage and Frequency Scaling

✍ Scribed by Firouzi, F.; Salehi, M.E.; Wang, F.; Fakhraie, S.M.; Safari, S.


Book ID
120836318
Publisher
IEEE
Year
2010
Weight
268 KB
Category
Article
ISBN
1424473217

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