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[IEEE 2010 IEEE Applied Power Electronics Conference and Exposition - APEC 2010 - Palm Springs, CA, USA (2010.02.21-2010.02.25)] 2010 Twenty-Fifth Annual IEEE Applied Power Electronics Conference and Exposition (APEC) - An improved winding loss analytical model of Flyback transformer

✍ Scribed by Yuan, Wei; Huang, Xiucheng; Meng, Peipei; Zhang, Guoxing; Zhang, Junming

Book ID: 115440899
Publisher: IEEE
Year: 2010
Tongue: English
Weight: 642 KB
Volume: 0
Category: Article
ISBN: 1424447828
DOI: 10.1109/apec.2010.5433633

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