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[IEEE 2010 IEEE Applied Power Electronics Conference and Exposition - APEC 2010 - Palm Springs, CA, USA (2010.02.21-2010.02.25)] 2010 Twenty-Fifth Annual IEEE Applied Power Electronics Conference and Exposition (APEC) - Oscillation-test technique for Buck voltage regulator

✍ Scribed by Huang, Jing-Yi; Wu, Chun-Hsun; Chang-Chien, Le-Ren; Chang, Soon-Jyh

Book ID: 118179538
Publisher: IEEE
Year: 2010
Tongue: English
Weight: 543 KB
Volume: 0
Category: Article
ISBN: 1424447828
DOI: 10.1109/apec.2010.5433374

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