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[IEEE 2010 IEEE 3rd International Nanoelectronics Conference (INEC) - Hong Kong, China (2010.01.3-2010.01.8)] 2010 3rd International Nanoelectronics Conference (INEC) - Characterization of Er-doped ZnO nanorod arrays for broadband antireflection

✍ Scribed by Cheng-Ying Chen, ; Yen-Chun Chao, ; Chin-An Lin, ; Jian-Wei Lo, ; Jr-Hau He,

Book ID: 121844112
Publisher: IEEE
Year: 2010
Weight: 306 KB
Category: Article
ISBN: 1424435439
DOI: 10.1109/INEC.2010.5424868

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