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[IEEE 2010 IEEE 3rd International Nanoelectronics Conference (INEC) - Hong Kong, China (2010.01.3-2010.01.8)] 2010 3rd International Nanoelectronics Conference (INEC) - Sub-wavelength imaging from multilayer superlens

✍ Scribed by Guixin Li, ; Jensen Li, ; Hoi Lam Tam, ; Che Ting Chan, ; Kok Wai Cheah,

Book ID: 125528883
Publisher: IEEE
Year: 2010
Weight: 194 KB
Category: Article
ISBN: 1424435439
DOI: 10.1109/INEC.2010.5424886

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