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[IEEE 2010 IEEE 19th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS) - Austin, TX, USA (2010.10.25-2010.10.27)] 19th Topical Meeting on Electrical Performance of Electronic Packaging and Systems - Parametric model order reduction from measurements

✍ Scribed by Lefteriu, S.; Antoulas, A. C.; Ionita, A.C.

Book ID: 126894809
Publisher: IEEE
Year: 2010
Weight: 322 KB
Category: Article
ISBN: 1424468655
DOI: 10.1109/epeps.2010.5642579

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