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[IEEE 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW 2010) - La Grande Motte, France (2010.06.7-2010.06.9)] 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW) - Methodology of virtual testing of trimmable analog circuits

✍ Scribed by Sobe, Udo; Bohme, Enno; Roochy, Karl-Heinz

Book ID: 126684308
Publisher: IEEE
Year: 2010
Weight: 594 KB
Category: Article
ISBN: 1424477921
DOI: 10.1109/IMS3TW.2010.5503010

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