[IEEE 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Dresden (2010.03.8-2010.03.12)] 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Increasing PCM main memory lifetime

[IEEE 2010 Design, Automation & Test in

✍ Narayanan, S; Sartori, J; Kumar, R; Jones, D L 📂 Article 📅 2010 🏛 IEEE ⚖ 250 KB

[IEEE 2010 Design, Automation & Test in

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[IEEE 2010 Design, Automation & Test in

✍ Strukov, Dmitri (author);Mishchenko, Alan (author) 📂 Article 📅 2010 🏛 Institute of Electrical and Electronics Engineers ⚖ 619 KB

[IEEE 2010 Design, Automation & Test in

✍ Strukov, Dmitri (author);Mishchenko, Alan (author) 📂 Article 📅 2010 🏛 Institute of Electrical and Electronics Engineers ⚖ 619 KB

[IEEE 2010 Design, Automation & Test in

✍ Katebi, Hadi; Markov, Igor L 📂 Article 📅 2010 🏛 IEEE ⚖ 267 KB

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✍ Dietrich, Manfred; Eichler, Uwe; Haase, Joachim 📂 Article 📅 2010 🏛 IEEE ⚖ 366 KB