[IEEE 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Dresden (2010.03.8-2010.03.12)] 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Digital statistical analysis using VHDL

[IEEE 2010 Design, Automation & Test in

✍ Narayanan, S; Sartori, J; Kumar, R; Jones, D L 📂 Article 📅 2010 🏛 IEEE ⚖ 250 KB

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✍ Leupers, Rainer; Thiele, Lothar; Xiaoning Nie, ; Kienhuis, Bart; Weiss, Matthias 📂 Article 📅 2010 🏛 IEEE ⚖ 782 KB

[IEEE 2010 Design, Automation & Test in

✍ Strukov, Dmitri (author);Mishchenko, Alan (author) 📂 Article 📅 2010 🏛 Institute of Electrical and Electronics Engineers ⚖ 619 KB

[IEEE 2010 Design, Automation & Test in

✍ Strukov, Dmitri (author);Mishchenko, Alan (author) 📂 Article 📅 2010 🏛 Institute of Electrical and Electronics Engineers ⚖ 619 KB

[IEEE 2010 Design, Automation & Test in

✍ Katebi, Hadi; Markov, Igor L 📂 Article 📅 2010 🏛 IEEE ⚖ 267 KB

[IEEE 2010 Design, Automation & Test in

✍ Ferreira, Alexandre P; Miao Zhou, ; Bock, Santiago; Childers, Bruce; Melhem, Ram 📂 Article 📅 2010 🏛 IEEE ⚖ 272 KB