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[IEEE 2010 68th Annual Device Research Conference (DRC) - Notre Dame, IN, USA (2010.06.21-2010.06.23)] 68th Device Research Conference - Temperature dependence of Ge/Si avalanche photodiodes

✍ Scribed by Dai, Daoxin; Bowers, John E; Lu, Zhiwen; Campbell, Joe C.; Kang, Yimin

No coin nor oath required. For personal study only.

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