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[IEEE 2010 27th International Conference on Microelectronics Proceedings - Nis, Serbia (2010.05.16-2010.05.19)] 2010 27th International Conference on Microelectronics Proceedings - TCAD modeling of NPN-SiGe-HBT electrical performance improvement through extrinsic stress layer

โœ Scribed by Al-Sa'di, M.; Fregonese, S.; Maneux, C.; Zimmer, T.


Book ID
118258302
Publisher
IEEE
Year
2010
Weight
528 KB
Volume
0
Category
Article
ISBN
1424472008

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