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[IEEE 2010 27th International Conference on Microelectronics Proceedings - Nis, Serbia (2010.05.16-2010.05.19)] 2010 27th International Conference on Microelectronics Proceedings - Electrical measurements in nanotechnology using single electron bipolar avalanche transistors

✍ Scribed by Popovic, Radivoje S.; Lany, Marc

Book ID: 111697204
Publisher: IEEE
Year: 2010
Weight: 637 KB
Volume: 0
Category: Article
ISBN: 1424472008
DOI: 10.1109/miel.2010.5490534

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