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[IEEE 2010 23rd International Conference on VLSI Design: concurrently with the 9th International Conference on Embedded Systems Design (VLSID) - Bangalore, India (2010.01.3-2010.01.7)] 2010 23rd International Conference on VLSI Design - Architectural Comparison of Analog and Digital Duty Cycle Corrector for High Speed I/O Link

✍ Scribed by Raghavan, Leneesh; Wu, Ting

Book ID: 120558392
Publisher: IEEE
Year: 2010
Weight: 637 KB
Category: Article
ISBN: 1424455413
DOI: 10.1109/VLSI.Design.2010.83

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