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[IEEE 2010 23rd International Conference on VLSI Design: concurrently with the 9th International Conference on Embedded Systems Design (VLSID) - Bangalore, India (2010.01.3-2010.01.7)] 2010 23rd International Conference on VLSI Design - On Minimization of Test Application Time for RAS

✍ Scribed by Adiga, Raghavendra; Arpit, Gandhi; Singh, Virendra; Saluja, Kewal K; Fujiwara, Hideo; Singh, Adit D.

Book ID: 120378026
Publisher: IEEE
Year: 2010
Weight: 277 KB
Category: Article
ISBN: 1424455413
DOI: 10.1109/VLSI.Design.2010.61

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