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[IEEE 2010 20th International Conference on Pattern Recognition (ICPR) - Istanbul, Turkey (2010.08.23-2010.08.26)] 2010 20th International Conference on Pattern Recognition - FIND: A Neat Flip Invariant Descriptor

✍ Scribed by Guo, Xiaojie; Cao, Xiaochun

Book ID: 126767413
Publisher: IEEE
Year: 2010
Weight: 631 KB
Category: Article
ISBN: 1424475422
DOI: 10.1109/ICPR.2010.131

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