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[IEEE 2010 20th International Conference on Pattern Recognition (ICPR) - Istanbul, Turkey (2010.08.23-2010.08.26)] 2010 20th International Conference on Pattern Recognition - Statistical Fourier Descriptors for Defect Image Classification

✍ Scribed by Timm, Fabian; Martinetz, Thomas

Book ID: 118067010
Publisher: IEEE
Year: 2010
Tongue: English
Weight: 543 KB
Volume: 0
Category: Article
ISBN: 1424475422
DOI: 10.1109/icpr.2010.1018

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