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[IEEE 2010 20th International Conference on Pattern Recognition (ICPR) - Istanbul, Turkey (2010.08.23-2010.08.26)] 2010 20th International Conference on Pattern Recognition - Fast Logo Detection and Recognition in Document Images

✍ Scribed by Li, Zhe; Schulte-Austum, Matthias; Neschen, Martin

Book ID: 121465981
Publisher: IEEE
Year: 2010
Tongue: English
Weight: 532 KB
Category: Article
ISBN: 1424475422
DOI: 10.1109/ICPR.2010.665

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