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[IEEE 2010 20th International Conference on Pattern Recognition (ICPR) - Istanbul, Turkey (2010.08.23-2010.08.26)] 2010 20th International Conference on Pattern Recognition - Document Logo Detection and Recognition Using Bayesian Model

✍ Scribed by Wang, Hongye

Book ID: 120759187
Publisher: IEEE
Year: 2010
Tongue: English
Weight: 477 KB
Category: Article
ISBN: 1424475422
DOI: 10.1109/ICPR.2010.483

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