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[IEEE 2010 12th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm) - Las Vegas, NV, USA (2010.06.2-2010.06.5)] 2010 12th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems - Prediction of electrical contact resistivity in thermoelectric modules (TEMs) from module-level measurements

✍ Scribed by Annapragada, S. Ravi; Salamon, Todd; Kolodner, Paul; Hodes, Marc; Garimella, Suresh V.

Book ID: 120589832
Publisher: IEEE
Year: 2010
Weight: 537 KB
Category: Article
ISBN: 1424453429
DOI: 10.1109/ITHERM.2010.5501317

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