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[IEEE 2010 11th Latin American Test Workshop - LATW - Punta del Este, Uruguay (2010.03.28-2010.03.31)] 2010 11th Latin American Test Workshop - Fault prediction in electrical valves using temporal Kohonen maps

✍ Scribed by Goncalves, Luiz F.; Schneider, Eduardo L.; Henriques, Renato Ventura B.; Lubaszewski, Marcelo; Bosa, Jefferson Luiz; Engel, Paulo Martins

Book ID: 120534815
Publisher: IEEE
Year: 2010
Weight: 670 KB
Category: Article
ISBN: 1424477867
DOI: 10.1109/LATW.2010.5550338

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