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[IEEE 2010 11th Latin American Test Workshop - LATW - Punta del Este, Uruguay (2010.03.28-2010.03.31)] 2010 11th Latin American Test Workshop - Test mode method and strategy for RF-based fault injection analysis for on-chip relaxation oscillators under EMC standard tests or RFI susceptibility characterization

✍ Scribed by Olmos, A.; Boas, A. Vilas; da Silva, E. R.; Silva, J. C.; Maltione, R.

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