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[IEEE 2010 11th International Workshop on Microprocessor Test and Verification (MTV) - Austin, Texas, USA (2010.12.13-2010.12.15)] 2010 11th International Workshop on Microprocessor Test and Verification - A Fault Grading Methodology for Software-Based Self-Test Programs in Systems-on-Chip

✍ Scribed by Ballan, O.; Bernardi, P.; Fontana, G.; Grosso, M.; Sanchez, E.

Book ID: 126624135
Publisher: IEEE
Year: 2010
Weight: 344 KB
Category: Article
ISBN: 1612842879
DOI: 10.1109/MTV.2010.16

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