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[IEEE 2010 11th International Symposium on Quality of Electronic Design (ISQED) - San Jose, CA, USA (2010.03.22-2010.03.24)] 2010 11th International Symposium on Quality Electronic Design (ISQED) - Thermal-aware lifetime reliability in multicore systems

✍ Scribed by Wang, Shengquan; Chen, Jian-Jia

Book ID: 125809972
Publisher: IEEE
Year: 2010
Weight: 251 KB
Category: Article
ISBN: 1424464544
DOI: 10.1109/ISQED.2010.5450548

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